MULTI-HIT 4-QUADRANT DLD SYSTEMS
4-quadrant delay line detector for parallel multi hit detection of electrons, ions, UV and X-ray with burst count rates of above 100 MCPS.
Typical applications: Particle detection with extremely high burst count rates in pulsed experiments, e.g. mass spectrometry (TOF-SIMS, RIMS, MALDI).
DLDS FOR USE WITH A PHOTOEMISSION ELECTRON MICROSCOPE (PEEM)
Standard delay line detector for photoemission electron microscopes. Delay line anode area: 36×36 mm&sub2; – mounting flange: DN63CF.
DLD mounted on a linear drive for in-situ exchange between DLD and the imaging unit of the PEEM. Delay line anode area: 40×40 mm&sub2;- mounting flange: DN63CF or DN100CF.
TIME RESOLVING X-RAY, EUV DETECTORS
DLD with polyimid window for the laterally and timeresolved detection of X-rays. Delay line anode area: 36×36 mm&sub2;.